A selection of our customers:

ASTER's satisfied customers


Latest news:

14-SEP-2010 to 16-SEP-2010:
BTW2010 - IEEE 9th Board Test Workshop - Agilent Technologies and ASTER are presenting a paper. Test Coverage Consultant - A coverage tool to explore the question:"What does it mean when the board test passes?" (Fort Collins, Colorado, USA)
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05-OCT-2010:
GOEPEL Technology Day - Learn about the new "TestWay Express" test coverage analysis tool from ASTER. You can still register online before or during the workshop. (Uttoxeter Racecourse, United Kingdom)
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10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
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10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
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13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
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06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
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23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
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29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
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03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
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05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
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20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
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24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
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30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
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09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
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10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
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17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
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10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
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26-MAY-2008:
May release of the ASTER Newsletter.
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19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
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08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
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28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
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19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
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13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
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25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
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22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
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15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
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15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
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02-MAY-2007:
May release of the ASTER Newsletter.
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28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
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28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
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08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
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23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
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16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
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14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
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19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
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03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
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FaultView™ - Fault Ticket Analyzer

Fault Ticket Analyzer

Save Board Repair Time with Interactive Fault Ticket Analyzer

Ideal user interface

FaultView can read a wide variety of fault tickets, capturing the information contained and incorporating it into an interactive color display. The display, presented on a standard PC, allows even novice operators to rapidly zoom in on a component's part description, physical position in the board layout and the exact place in the schematic where the component is used.

FaultView

Escape from thick paper schematics

FaultView needs as input only the files commonly used to document a printed circuit board. FaultView can then create detailed associations which appear as highlighted hot-links when the fault ticket, layout, schematic and part description are displayed. The familiar appearance and text of the displayed documents is preserved. Users can effortlessly navigate between the displayed documents, much like a web browser navigates through web pages.

Increase throughput 50-100%

FaultView never makes the user wade through irrelevent sections of ICs or through comment fields as do products based on text searches. FaultView's feature set is not bloated with seldom used features. FaultView's features are carefully chosen to be simple, useful, and fast. FaultView zooms in on the exact component, pin, net and even ATE nail needed, giving users all the information needed to track down any problem quickly. FaultView's interactive features reflect the experience of real world test engineers, allowing users to work smarter not harder. Many have reported 50-100% increases in their throughput of repaired boards.

Automated Quality Tracking

FaultView can be configured into a system using bar code readers, networks and databases so that failure data for an entire factory can be aggregated, analyzed and acted upon in real time.

Minimal training required

Anyone who can surf the WWW can learn to use FaultView. FaultView's multlingual interface currently supports English, German and French.

Supports popular CAD formats

FaultView works with the files you have. FaultView automatically creates an interactive circuit board debug and repair tool from a wide array of CAD files. Some of the layout data format supported include CadLink, Cadence Allegro, Alcatel DOCICA, Fabmaster, Mentor Graphics, Unicad, Unicam, VALOR ODB++. Some of the schematic data formats supported include Ariadne, Bartels, Cadence, Cadstar, Eagle, Mentor Graphics, PADS, Protel, TopCad, System Designer, Ultiboard, Unicad, ViewLogic, Veribest and Visula SCM. Others are in development. Contact ASTER for the latest details on your formats.

Locate shorts quickly FaultView speeds the location of shorts by intelligently highlighting areas where solder bridges are most likely to form.

Fixture diagnosis FaultView simplifies test fixture debugging and maintenance. FaultView's ability to display detailed tester channel and pogo information simplifies fixture repair and reduces downtime.

Customizable Buy only what you need. FaultView can be configured as a simple "component locater" or it can be part of a comprehensive failure tracking system using bar code readers, networks and databases.

Good value FaultView is a value leader. No large investment in computer hardware is required. FaultView can operate efficiently on legacy Pentium based computers running Windows 95 with as little as 32MB of RAM. When used with modern Pentium class PCs running WIN98, NT4.0 or beyond, FaultView is lightning fast.

Requirements Requires Intel architecture PC with at least 32MB RAM running Microsoft Windows operating system (Windows 9x, Me, NT, 2000, XP).

Additional information



 
     
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