A selection of our customers:
25-APR-2017 to 27-APR-2017:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N14 (Shanghai, China)
14-FEB-2017 to 16-FEB-2017:
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
08-NOV-2016 to 11-NOV-2016:
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools.
12-SEP-2016 to 15-SEP-2016:
Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, USA)
26-APR-2016 to 28-APR-2016:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, China)
15-MAR-2016 to 17-MAR-2016:
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, USA)
March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
TestWay news 2015
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
10-NOV-2015 to 13-NOV-2015:
Productronica - Visit ASTER at Productronoca, Hall A1, Booth 232. Information & registration (Munich, Germany)
03-NOV-2015 to 05-NOV-2015:
IEEE AUTOTESTCON - Visit ASTER at the IEEE AutoTestCon, Booth 431. Information & registration. Press release (National Harbor, USE)
21-APR-2015 to 23-APR-2015:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, China)
24-FEB-2015 to 26-FEB-2015:
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
11-NOV-2014 to 14-NOV-2014:
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Germany)
23-APR-2014 to 25-APR-2014:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth A1-1E85 (Shanghai, China)
25-MAR-2014 to 27-MAR-2014:
IPC APEX EXPO - Booth 607 (Las vegas, USA)
FaultView™ - Fault Ticket Analyzer
Fault Ticket Analyzer
Save Board Repair Time with Interactive Fault Ticket Analyzer
Ideal user interface
FaultView can read a wide variety of fault tickets, capturing the information
contained and incorporating it into an interactive color display. The display,
presented on a standard PC, allows even novice operators to rapidly zoom in on a
component's part description, physical position in the board layout and the
exact place in the schematic where the component is used.
Escape from thick paper schematics
FaultView needs as input only the files commonly used to document a printed
circuit board. FaultView can then create detailed associations which appear as
highlighted hot-links when the fault ticket,
and part description are displayed. The familiar appearance and text of the
displayed documents is preserved. Users can effortlessly navigate between the
displayed documents, much like a web browser navigates through web pages.
Increase throughput 50-100%
FaultView never makes the user wade through irrelevent sections of ICs or
through comment fields as do products based on text searches. FaultView's
feature set is not bloated with seldom used features. FaultView's features are
carefully chosen to be simple, useful, and fast. FaultView zooms in on the exact
component, pin, net and even ATE nail needed, giving users all the information
needed to track down any problem quickly. FaultView's interactive features
reflect the experience of real world test engineers, allowing users to work
smarter not harder. Many have reported 50-100% increases in their throughput of
Automated Quality Tracking
FaultView can be configured into a system using bar code readers, networks and
databases so that failure data for an entire factory can be aggregated, analyzed
and acted upon in real time.
Minimal training required
Anyone who can surf the WWW can learn to use FaultView. FaultView's
multlingual interface currently supports English, German and French.
Supports popular CAD formats
FaultView works with the files you have. FaultView automatically creates an
interactive circuit board debug and repair tool from a wide array of CAD files.
Some of the layout data format supported include CadLink, Cadence Allegro,
Alcatel DOCICA, Fabmaster, Mentor Graphics, Unicad, Unicam, VALOR ODB++. Some of
the schematic data formats supported include Ariadne, Bartels, Cadence, Cadstar,
Eagle, Mentor Graphics, PADS, Protel, TopCad, System Designer, Ultiboard,
Unicad, ViewLogic, Veribest and Visula SCM. Others are in development.
ASTER for the latest details on your formats.
Locate shorts quickly
FaultView speeds the location of shorts by intelligently highlighting areas
where solder bridges are most likely to form.
FaultView simplifies test fixture debugging and maintenance. FaultView's
ability to display detailed tester channel and pogo information simplifies
fixture repair and reduces downtime.
Buy only what you need. FaultView can be configured as a simple "component
locater" or it can be part of a comprehensive failure tracking system using bar
code readers, networks and databases.
FaultView is a value leader. No large investment in computer hardware is
required. FaultView can operate efficiently on legacy Pentium based computers
running Windows 95 with as little as 32MB of RAM. When used with modern Pentium
class PCs running WIN98, NT4.0 or beyond, FaultView is lightning fast.
Requires Intel architecture PC with at least 32MB RAM running Microsoft
Windows operating system (Windows 9x, Me, NT, 2000, XP).