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A selection of our customers:
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Latest news:
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10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
 19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
26-MAY-2008:
May release of the ASTER Newsletter.
19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
02-MAY-2007:
May release of the ASTER Newsletter.
28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
>> More...
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QuadView: Next Generation Viewers
QuadView adds new dimension to PCB schematic & layout viewing
ASTER has introduced the QuadView next generation viewers to their product
portfolio. QuadView is a powerful set of scalable board viewing modules that can be used
either as a standalone viewer or fully integrated within customer's applications.
QuadView's unique digitization capability allows users to create schematic views directly
from searchable PDF files, and the innovative ‘Netlist Navigator’ provides virtual schematic
views reconstructed directly from a board netlist. Layout views can be created from industry
standard formats such as, GENCAD, CAMCAD, FATF, ODB++, or directly from any native CAD layout
data such as Cadence, Mentor, Zuken, etc. The fault ticket analyzer provides full interaction
between component and net references in any type of paperless repair fault ticket, exported
from test, repair or inspection systems.
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Key Product benefits
Ease of Use
Powerful, scalable visualization environment, consisting of schematic, netlist,
layout and fault ticket viewing modules that can be used either standalone or
integrated within customer’s applications. No pre-processing of CAD data needed.
Automated schematic creation
Unique digitization capability that allows users to create a schematic view
directly from a searchable PDF file. Interactive with layout and Netlist Navigator.
Netlist Navigator
Reconstruct “virtual schematics” directly from a netlist, to provide a visual
netlist navigation capability that includes advanced nodal detail.
Layout from native CAD formats
Create layout view from standard CAD formats such as GENCAD, CAMCAD, FATF,
ODB++, or direct from native CAD layout data.
Fault ticket hot-links
Anyone who can surf the WWW can learn to use QuadView. Navigate between component and net references that appear as highlighted
hot-links within the paperless fault ticket.
Fully Interactive Cross-probing
Cross-probe between layout, schematic and netlist viewers, and other products
within the ASTER portfolio such as TestWay and Quad.
Flexible color assignment
Visualize test coverage and component pin properties using the QuadView color
assignment palette, to simplify analysis and fault class recognition.
Functional test editor
Declare functional test coverage on both component and pin level. Simplify
functional test diagnosis with the “Sherlock” algorithm.
Short-circuit search assistant
Reduce the time to locate short-circuits by intelligently highlighting areas
where solder bridges are most likely.
Legacy product support
Migration Kit provides full backwards compatibility with legacy products
DebugPlus,
RepairPlus and
FaultView.
Tell me more
Additional information
Other products
- TPQR, Test Program Quality Report
- TestWay, Board testability analyzer
- Quad, Quality advisor and manager
- QuadFeederSafe, make your feeder settings secure
- WildScan, Boundary-Scan test translation
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