|
|
A selection of our customers:
|
|
Latest news:
|
14-SEP-2010 to 16-SEP-2010:
BTW2010 - IEEE 9th Board Test Workshop - Agilent Technologies and ASTER are presenting a paper. Test Coverage Consultant - A coverage tool to explore the question:"What does it mean when the board test passes?" (Fort Collins, Colorado, USA)
 05-OCT-2010:
GOEPEL Technology Day - Learn about the new "TestWay Express" test coverage analysis tool from ASTER. You can still register online before or during the workshop. (Uttoxeter Racecourse, United Kingdom)
10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
26-MAY-2008:
May release of the ASTER Newsletter.
19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
02-MAY-2007:
May release of the ASTER Newsletter.
28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
>> More...
|
|
|
|
|
Choose your
language:
|
|
|
|
| |
RepairPlus™ - Layout viewer
Layout Viewer
RepairPlus is a flexible software for graphical display of PCB layout for
repair and optical inspection. Equipped with a clear and simple user interface,
fast search functions and powerful graphics capabilities, RepairPlus provides
fast graphic generation, the automatic display of possible short locations, the
display of test fixture nail positions and the clear display of even the largest
boards using picture-in-picture zoom technology. It fits your industrial
environment and becomes a natural part of your PC Board repair cycle. It enables
you to reduce the repair time from 15 to 40%. Repair Plus may be used either
standalone or combined with another member of the QUAD family:
DebugPlus for schematic and
FaultView for fault tickets.
Technical description:
- Easy and fast graphic generation.
- Fast search of components, nets, pins or nails with automatic zoom on
the right element.
- Localization of the most probable areas in case of short-circuit.
- Display of test fixture nail positions.
- Visual inspection functions including the capability to add special text
information.
- Possibility to have interaction between schematic, Fault tickets and
layout (option).
- DDE interface for communication with external applications.
- Multilingual user interface (English, French, German)
- Designed for Microsoft Windows (Windows 9x, Me, NT4, NT2000, XP)
Cost savings
The RepairPlus ease-of-use and associated repair time savings, means a fast
return on investment. These savings can be attributed to:
- Reduction in time taken for component, short, net, nail searches of
about 80%.
- Reduction in time and cost for preparation, maintenance, and edition of
paperwork.
- Time saving during debug of test program.
- Reduction in the total repair time of between 15% to 40%.
Additional information
|
|
|
