The ASTER Technologies
March 2016 Volume 14
Inside this issue...
|Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas|
ASTER Technologies will be exhibiting at IPC APEX EXPO 2016 show in Las Vegas, during the 15th to 17th March, 2016.
Why not come and visit us in Stand 1651?
Please join us and discuss any requirements you may have relating to Board & System visualization, Electrical DfT analysis, Test Coverage analysis, Test program generation, CAD translation or Quality Management.
ASTER will also be demonstrating their advanced technology that enables lean NPI. See below for more details.
The new coverage analyzer for wiring and cable tester will be introduced.
Visit Official IPC APEX Expo web site
Press release: Coverage analyzer for wiring and cable testers
|TestWay Express analyzes test coverage for lean manufacturing|
TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to test flow:
Test is essential for improving product quality by striving to detect and prevent faults on a product. This maximizes the number of good products shipped to the customer. TestWay helps to:
CAD converter, Comparative Data Checker, Bed of nails re-use, automatic documentation for Assembly or Test will be demonstrated.
ASTER Technologies will present a technical white paper entitled "DfX - Design for Excellence - How to build a consistent design-to-test flow in order to deliver defect-free PCBA's" at the 29th Aerospace Testing Seminar, in Los Angeles between the 27th and 28th October 2015.
Download the ATS2015-Design For Excellence…
Download the TestWay Express brochure…
|System viewer: twSystem|
twSystem can be used in the design environment to assist DfT and test coverage analysis at the schematic capture stage
as well as during prototype troubleshooting. Within the manufacturing environment, it becomes an integral part of the
repair cycle, assisting in the locating of faults and significantly reducing repair time.
twSystem is designed to import native CAD data for each board comprising the system. In addition, a formal description of the backplane or cables is used to describe the interconnection of the boards.
Product performance is a critical issue in order to speed-up loading, viewing, searching and navigation, even when the system includes more than 10 boards with 3000 components on each.
When the CAD data of the system is loaded, twSystem delivers various representations of the system.
|QuadView deeply integrated with TestStand and LabView|
A functional test solution is developed, primarily within the hardware design environment, as a test vehicle for verifying that a PCB meets its design criteria.
Once the design validation and prototyping test phases are complete, the test vehicle is transferred to the Test Engineering department.
It is then used as a functional test platform to verify that manufactured products meet their performance specification and are 'fit for purpose' to be shipped to the customer.
The functional test stage is the final PCB quality gate.
However, functional testers are a challenge because:
Please contact me for a demonstration…
|For more information on any of the topics contained in this issue of the ASTER Technologies newsletter, please contact ASTER using the contact details listed below.|
55 bis rue de Rennes
35510 CESSON SEVIGNE
Phone: +33 (0)2 99 83 01 01
Fax: +33 (0)2 99 83 01 00
ASTER Technologies LLC
P.O. Box 7163
Colorado Springs CO 80933-7163
United States of America
Phone: +1 719-264-7698
Mob: +1 719-331-0346
ASTER Technologies Ltd.
PO Box 327
Tarporley, Cheshire, CW6 9WD
Phone: +44 (0)1829 261557
Mob: +44 (0)7711 927840