ASTER Newsletter May 2007

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QUAD News
The ASTER Technologies
Newsletter

May 2007 Volume 3 Issue 1

Inside this issue...

Visit ASTER at the NEPCON 2007 in Birmingham
ASTER announces a X10 improvement in QuadView loading
AIRBUS chooses QuadView as Debug/Repair viewer
GOEPEL announces QuadView within the CASCON test environment
ASTER demonstrates TAKAYA test program optimization at the Accelonix 'Test in Production Seminar' in Eindhoven, The Netherlands
More test coverage loaders for TestWay
All ASTER products are fully compatible with Windows VISTA

Visit ASTER during the NEPCON 2007 Show at the NEC in Birmingham

ASTER Technologies will be exhibiting at the NEPCON 2007 show at the NEC in Birmingham, during the 15th to 17th May, 2007. Why not come and visit us in Hall 1, Stand G46 and discuss any requirements you may have relating to Electrical DfT analysis, Test Coverage analysis or Quality Management.

ASTER will also be demonstrating their advanced viewing technology that enables instant visualization of board designs. Read below for more details.

Click here to register...

ASTER Technologies announces a X10 improvement in QuadView loading

ASTER has announced a X10 improvement in the time it takes to load schematic, layout and netlist navigation views within their QuadView next generation viewer. Using the unique Quick Start technology, significant improvements are made in the time taken to load board layout views within the repair environment, enabling users to quickly and easily diagnose and repair faults.

Christophe LOTZ, Product Director of ASTER Technologies said, "We see significant benefits in the ability to load even the most complex of board views in a matter of seconds, allowing instant visualization of board designs in either the development and repair environments."

Try it...

AIRBUS chooses QuadView as Debug/Repair viewer

David CUMER said, "QuadView has the flexibility and performance to meet our current and future board visualization requirements."

AIRBUS chooses QuadView from ASTER Technologies as Debug/Repair Viewer to have a powerful tool to visualize PCB and navigate easily in the schematic.

David CUMER, Test Engineering Manager at AIRBUS said, "QuadView has the flexibility and performance to meet our current and future board visualization requirements. Not only can it be used as a stand alone product for Debug and Repair, but it is also fully interactive with the TestWay and QUAD products we also use from ASTER."

GOEPEL announce the integration of the QuadView within the System CASCON test environment

"This is a clear indication of ASTER's continued commitment to work closely with the industry's leading test equipment suppliers..."

ASTER Technologies and GOEPEL Electronics have announced collaboration in integrating the QuadView layout viewer within the System CASCON test development environment, during the inaugural GOEPEL Electronics, Boundary-Scan Day in the UK.

Pete COLLINS, UK Sales & Marketing Manager said, "We are pleased to be associated with GOEPEL Electronics and have the opportunity to demonstrate the seamless integration of our QuadView viewers within the System CASCON boundary-scan test development environment. It is a clear indication of ASTER’s continued commitment to work closely with the industry's leading test equipment suppliers. "

ASTER demonstrates TAKAYA test program optimization at the Accelonix 'Test in Production Seminar' in Eindhoven, The Netherlands

ASTER demonstrated how TestWay can optimize existing TAKAYA test programs to significantly reduce test and debug time.

ASTER was pleased to be invited to present the advanced features of TestWay at the recent Test in Production Seminar, organised by Accelonix NL and held in Eindhoven, The Netherlands on the 8th February, 2007. It was an opportunity to demonstrate to the attendees how TestWay fits into the design and manufacturing test flow to improve product yield from design through to production.

ASTER demonstrated how TestWay could interface with the TAKAYA (Flying Probe) test program to optimize existing pre-debug or post-debug test programs to reflect the test coverage optimization predicted by TestWay in analysing an enhanced test strategy scenario that uses a combination of complimentary test solutions, such as AOI and Boundary-Scan (BST) test. This optimization process can significantly reduce test and debug time by between 30% to 80% depending on the combined test steps (AOI, AXI, FPT, BST, FT) executed by the overall test line.

Accelonix NL, based in Eindhoven, The Netherlands, represent ASTER Technologies in the Benelux region.