The ASTER Technologies
Newsletter
Nov 2006 Volume 2 Issue 1
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QUAD News The ASTER Technologies Newsletter |
Nov 2006 Volume 2 Issue 1 |
| Inside this issue... | Visit ASTER at the Electronica 2006 Show in Munich | |
ASTER Technologies will be exhibiting at the Electronica 2006 show at the New Munich Trade Fair Centre in
Germany, during the 14th to 17th November. Why not come and visit us in Hall A1, Stand 548 and discuss
any requirements you may have relating to Electrical DfT analysis, Test Coverage analysis or Quality Management.
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| ASTER Technologies and TEMENTO Systems announce Strategic Partnership | ||
| ASTER, have announced the forming of a strategic partnership that enables integration between
ASTER’s, TestWay, Electrical DfT and Fault Coverage Analyser with TEMENTO’s Boundary-Scan Test
Development environment. This integration methodology allows electronics designers and test engineers to benefit
from conducting boundary-scan design for test and test coverage analysis of PCB designs at the earliest stage in
the development cycle, ensuring that satisfactory measures have been incorporated within designs to achieve
optimal test coverage, before developing the boundary-scan test programs. Christophe LOTZ, Director of the ASTER product division said, "We are pleased to be associated with TEMENTO Systems in extending the export capability of TestWay. It is a clear indication of ASTER’s continued commitment to work closely with test equipment suppliers, to integrate the testability analysis features of TestWay with those of third party test development tools. This provides new opportunities to deliver the optimal test solution at the lowest possible cost."
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| “QUADView” adds a new dimension to PCB schematic and layout viewing | ||
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ASTER has introduced the QuadView next generation viewers to their product
portfolio. QuadView is a powerful set of scalable board viewing modules that can be used
either as a standalone viewer or fully integrated within customer’s applications.QuadView’s unique digitization capability allows users to create schematic views directly from searchable PDF files, and the innovative ‘Netlist Navigator’ provides virtual schematic views reconstructed directly from a board netlist. Layout views can be created from industry standard formats such as, GENCAD, CAMCAD, FATF, ODB++, or directly from any native CAD layout data such as Cadence, Mentor, Zuken, etc. The fault ticket analyser provides full interaction between component and net references in any type of paperless repair fault ticket, exported from test, repair or inspection systems.
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| ASTER presents technical paper at the 5th IEEE Board Test Workshop in Fort Collins, USA | ||
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Christophe LOTZ, Product Director of ASTER
Technologies presented a technical paper on Functional Board Test – Defect
Coverage Analysis at the recent 5th IEEE Board Test Workshop, held at Fort
Collins, USA on the 14th & 15th September, 2006. This paper describes how the PPVS test coverage model can be used to calculate board level coverage using a functional test (FT) strategy. Christophe Lotz said, "We see real benefits in being able to estimate test coverage provided by functional board test, because in many situations, optimal test coverage is not achievable through structural testing, or it may be that the current test strategy provides inadequate structural test coverage due to limited access." |
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| ASTER appoints RDT as their distributor in Israel | ||
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ASTER are pleased to announce the decision to appoint RDT Equipment & Systems Ltd as the official representative for ASTER products in Israel. RDT Equipment & Systems, who are also the official distributor for products from Agilent Technologies and JTAG Technologies, will distribute and support the ‘TestWay’ suite of Electrical Board DfT (Design for Test) and Fault Coverage Analysis tools from its main office in Tel Aviv. "We are extremely pleased to be working closely with RDT Equipment & Systems because RDT has an excellent track record of sales, service and support in the Israeli test industry, and are perfectly placed to add 'TestWay' to their portfolio of complementary test products. There are a significant number of complex products being developed by Israeli companies that we believe will benefit significantly from performing electrical DfT and fault coverage analysis, early in the design cycle" said Pete Collins, sales and marketing manager for ASTER Technologies.
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| For more information on any of the topics contained in this issue of the ASTER Technologies newsletter, please contact ASTER using the contact details listed below. |
| Corporate Headquarters ASTER Technologies 55 bis rue de Rennes 35510 CESSON SEVIGNE FRANCE Phone: +33 (0)2 99 83 01 01 Fax: +33 (0)2 99 83 01 00 E-mail: sales@aster-technologies.com |
United Kingdom ASTER Technologies Ltd. PO Box 327 Tarporley Cheshire, CW6 9WD Phone: +44 (0)1829 261557 Mob: +44 (0)7711 927840 E-mail: sales-uk@aster-technologies.com |
